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VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

Contributor(s): Material type: TextTextSeries: The Morgan Kaufmann series in systems on siliconPublication details: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.Description: xxx, 777 p. : ill. ; 25 cmISBN:
  • 0123705975 (hardcover : alk. paper)
  • 9780123705976
Subject(s): DDC classification:
  • 621.39/5 22
LOC classification:
  • TK7874.75 .V587 2006
Online resources:
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Item type Current library Home library Shelving location Call number Status Barcode
Books Books Main Campus Library University of Eastern Africa, Baraton Main Stack TK 7874.75 .V587 2006 (Browse shelf(Opens below)) Available 66105

Includes bibliographical references and index.

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