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Semiconductor measurements and instrumentation / W. R. Runyan and T. J. Shaffner.
Material type:
TextPublication details: New York : McGraw-Hill, 1997.Edition: 2nd edDescription: x, 453p ; 23 cmISBN: - 0070576971
| Item type | Current library | Home library | Shelving location | Call number | Status | Barcode | |
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Main Campus Library | University of Eastern Africa, Baraton | Main Stack | QC 611.24 .R86 1997 c2 (Browse shelf(Opens below)) | Available | 57035 | |
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Main Campus Library | University of Eastern Africa, Baraton | Main Stack | QC 611.24 .R86 1997 c1 (Browse shelf(Opens below)) | Available | 57036 | |
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Books
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Main Campus Library | University of Eastern Africa, Baraton | Main Stack | QC 611.24 .R86 1997 c.3 (Browse shelf(Opens below)) | Available | 61382 |
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| QC 451 .H65 2004 c.2 Modern spectroscopy / | QC 454 .M6 D4613 2005 c.1 Molecular physics : | QC 454 .M6 D4613 2005 c.2 Molecular physics : | QC 611.24 .R86 1997 c.3 Semiconductor measurements and instrumentation / | QC 611.24 .R86 1997 c1 Semiconductor measurements and instrumentation / | QC 611.24 .R86 1997 c2 Semiconductor measurements and instrumentation / | QC 611.8 .M4 P4713 2009 c.1 Physics and operation of silicon devices in integrated circuits |
Includes index.
Open access.
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