TY  - BOOK
AU  - Runyan,W.R.
AU  - Shaffner,T.J.jtauthor
TI  - Semiconductor measurements and instrumentation
SN  - 0070576971
PY  - 1997///
CY  - New York
PB  - McGraw-Hill
KW  - Semiconductors
KW  - Physical measurements
N1  - Includes index; Open access
ER  -