| 000 | 00830nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | rea00032375 | ||
| 005 | 20190704021409.0 | ||
| 008 | s2003 e 001 0 eng d | ||
| 020 | _a0470847123 | ||
| 035 | _z58898 | ||
| 039 |
_a32370 _cTLC |
||
| 100 | 1 | _aWatts, John F. | |
| 245 | 1 | 3 |
_aAn introduction to surface analysis by XPS and AES / _cJohn F. Watts, John Wolstenholme. |
| 260 |
_aWest Sussex, England : _bJohn Wiley, _c2003. |
||
| 300 |
_ax, 212p : _bill. ; _c23 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 506 | _aOpen access. | ||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. |
|
| 650 | 0 | _aElectron spectroscopy. | |
| 700 | 1 | _aWolstenholme, John jt.author. | |
| 949 |
_aBMAIN _cTP156 _d.S95 W373 2003 _g58898 _5N |
||
| 961 | _t1 | ||
| 999 |
_c25332 _d25332 |
||