| 000 | 01031nam a2200325 a 4500 | ||
|---|---|---|---|
| 001 | rea00030981 | ||
| 005 | 20190704083416.0 | ||
| 008 | s1997 nyu e 001 0 eng d | ||
| 010 | _a 9726081 | ||
| 020 | _a0070576971 | ||
| 035 | _z57035 | ||
| 039 |
_a30976 _cTLC |
||
| 100 | 1 | _aRunyan, W. R. | |
| 245 | 1 | 0 |
_aSemiconductor measurements and instrumentation / _cW. R. Runyan and T. J. Shaffner. |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bMcGraw-Hill, _c1997. |
||
| 300 |
_ax, 453p ; _c23 cm. |
||
| 504 | _aIncludes index. | ||
| 506 | _aOpen access. | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 | _aPhysical measurements. | |
| 700 | 1 | _aShaffner, T. J. jt. author. | |
| 949 |
_aBMAIN _cQC611.24 _d.R86 1997 c2 _g57035 _5N |
||
| 949 |
_aBMAIN _cQC611.24 _d.R86 1997 c1 _g57036 _5N |
||
| 949 |
_aEMAIN _cQC611.24 _d.R86 1997 _g61382 _5N |
||
| 961 | _t1 | ||
| 999 |
_c37744 _d37744 |
||